Title :
Reliability of VCSELs for >25Gb/s
Author :
Guenter, James ; Hawkins, Bobby ; Hawthorne, Robert ; Landry, Gary
Author_Institution :
Finisar Corp., Allen, TX, USA
Abstract :
The next individual-channel VCSEL (Vertical Cavity Surface Emitting Laser) node for data communications is 25 Gbps or higher. Providing the required reliability becomes ever more challenging as the speeds increase, but possible with proper design.
Keywords :
data communication; semiconductor device reliability; surface emitting lasers; VCSEL node; VCSEL reliability; data communications; vertical cavity surface emitting laser node; Acceleration; Data communication; Reliability engineering; Stress; Vertical cavity surface emitting lasers;
Conference_Titel :
Optical Fiber Communications Conference and Exhibition (OFC), 2014
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-5575-2994-7
DOI :
10.1364/OFC.2014.M3G.2
