DocumentCode :
1796597
Title :
An efficient reduction approach to test suite
Author :
Pan Liu
Author_Institution :
Coll. of Comput. Eng. & Sci., Shanghai Bus. Sch., Shanghai, China
fYear :
2014
fDate :
June 30 2014-July 2 2014
Firstpage :
1
Lastpage :
5
Abstract :
The paper presents a novel reduction approach to test suite in regression testing. Our approach selects a test case from those redundant test cases with the same rank according to the boundary coverage taken as second coverage criterion. Different from the previous researches for the selection of the second coverage criterion to assist test suite reduction, our approach bases on our empirical point of view that some faults in the program lie on its boundary of the program. Therefore test cases picked by our approach have the higher probability to find software errors. An algorithm is proposed to realize our approach. In addition, we also discuss the relationship between our approach with three traditional heuristics. Through a simple exampke, we illustrate our algorithm for test suite reduction.
Keywords :
probability; program testing; boundary coverage; novel reduction approach; probability; regression testing; second coverage criterion; software errors; test suite reduction; Fault detection; Heuristic algorithms; Minimization; Redundancy; Software; Software engineering; Testing; regression testing; software testing; test suite reduction; the boundary coverage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD), 2014 15th IEEE/ACIS International Conference on
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/SNPD.2014.6888743
Filename :
6888743
Link To Document :
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