Title :
Self-aware and self-expressive driven fault tolerance for embedded systems
Author :
Nya, Tatiana Djaba ; Stilkerich, Stephan C. ; Siemers, Christian
Author_Institution :
Innovations, Airbus Group, Munich, Germany
Abstract :
The growing complexity and size of computing systems as well as the unpredictability about changes in their deployment environment make their design increasingly challenging; especially for safety critical systems. Specifically the recognition of a fault within a system might be not only time consuming but also difficult in terms of reliability and completeness. This paper presents an approach to fault tolerance based on statistical features using the concepts of self-awareness and self-expression. These features characterize the behaviour of components, they are weighted and can be compared to measured values during runtime to characterize the well-behaviour of the system. Simulations show that this approach, used with the self-awareness and self-expression system layers, combines failure recognition and recovery with effective system design.
Keywords :
embedded systems; fault tolerant computing; safety-critical software; statistical analysis; system recovery; completeness; computing system; deployment environment; embedded systems; failure recognition; failure recovery; fault recognition; reliability; safety critical system; self-aware driven fault tolerance; self-expressive driven fault tolerance; statistical feature; system design; Fault tolerance; Fault tolerant systems; Instruction sets; Mathematical model; Safety; Temperature measurement; Time measurement; embedded systems; fault tolerance; safety-critical systems; self-awareness; self-expression; statistical feature;
Conference_Titel :
Intelligent Embedded Systems (IES), 2014 IEEE Symposium on
Conference_Location :
Orlando, FL
DOI :
10.1109/INTELES.2014.7008982