Title :
Reconfigurable virtual test system on performance of circuit
Author :
Xu, Licheng ; Zhang, Yu ; Wang, Zhaoqing ; Tie, Zhixin
Author_Institution :
Dept. of Comput. Sci., Zhejiang Sci-Tech Univ., Hangzhou, China
Abstract :
This document presents and demonstrates the design of a reconfigurable system in the low-power circuit testing, based on the data acquisition platform which useing virtual instrument technology. The circuit performance automatic testing system has been developed which is reliable,stable and powerful. The use of virtual instrument technique enables test engineers to shorten the development cycle, and development efficiency has been greatly improved. Meanwhile, the design of reconfigurable strategy, makes test engineers very easy to test the circuit according to their own custom testing programs, and makes the system meets the different circuit performance testing, and reduces test engineer´s duplication of work, significantly improves the efficiency of the test.
Keywords :
data acquisition; electronic engineering computing; integrated circuit design; integrated circuit testing; reconfigurable architectures; virtual instrumentation; circuit performance; circuit performance automatic testing system; custom testing programs; data acquisition platform; development cycle; development efficiency; low-power circuit testing; reconfigurable virtual test system; virtual instrument technology; Instruments; Manuals; Universal Serial Bus; Volume measurement; circuit test; data acquisition; strategy; virtual instrument;
Conference_Titel :
Computer Science and Network Technology (ICCSNT), 2011 International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4577-1586-0
DOI :
10.1109/ICCSNT.2011.6182244