DocumentCode
1800908
Title
A simulation-based method for estimating defect-free I/sub DDQ/
Author
Maxwell, P.C. ; Rearick, J.R.
Author_Institution
Integrated Circuit Bus. Div., Hewlett-Packard Co., Palo Alto, CA, USA
fYear
1997
fDate
5-6 Nov. 1997
Firstpage
80
Lastpage
84
Abstract
This paper presents a switch-level simulation-based method for estimating quiescent current values. The simulator identifier transistors that are in the proper state to experience leakage mechanisms. This information is combined with data about both the size of these transistors and various process parameters in order to calculate the actual I/sub DDQ/ value. SPICE simulation results are also presented on a variety of circuits to both calibrate the simulator, and to demonstrate state, time and sequence dependencies of circuits.
Keywords
circuit analysis computing; I/sub DDQ/ value; SPICE simulation; defect-free I/sub DDQ/ estimation; leakage mechanisms; quiescent current values; simulation-based method; switch-level simulation; CMOS process; Circuit simulation; Circuit testing; Companies; Fabrication; Geometry; Leakage current; SPICE; State estimation; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
Conference_Location
Washington, DC, USA
Print_ISBN
0-8186-8123-3
Type
conf
DOI
10.1109/IDDQ.1997.633018
Filename
633018
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