• DocumentCode
    1803255
  • Title

    Evaluating the Expressiveness of Domain Specific Modeling Languages Using the Bunge-Wand-Weber Ontology

  • Author

    Becker, Jörg ; Bergener, Philipp ; Breuker, Dominic ; Räckers, Michael

  • Author_Institution
    Univ. of Munster, Munster, Germany
  • fYear
    2010
  • fDate
    5-8 Jan. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Business Process Management is becoming an ever more important aspect for organizations alongside with Business Process Diagrams as a tool to describe business processes. So far process modeling has been mainly performed with generic process modeling languages. These approaches have however limitations when it comes to the needs of specific problem domains or automated process analysis. Semantic building block based languages (SBBL) aim to overcome those limitations by integrating domain semantics in the modeling language. However, this class of languages is only useful if they exhibit the same expressiveness as generic languages. In this paper we strive to answer this question by comparing the expressiveness of the SBBL language PICTURE with ARIS as a generic language based on the Bunge-Wand-Weber ontology, showing that PICTURE has hardly construct deficits compared to ARIS while showing less construct redundancy and construct overload in its constructs.
  • Keywords
    business data processing; business process re-engineering; ontologies (artificial intelligence); simulation languages; ARIS; Bunge Wand Weber ontology; automated process analysis; business process diagrams; business process management; domain specific modeling languages; generic process modeling language; semantic building block based languages; Conference management; Data mining; Decision making; Information analysis; Information management; Instruments; Management information systems; Ontologies; Usability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Sciences (HICSS), 2010 43rd Hawaii International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1530-1605
  • Print_ISBN
    978-1-4244-5509-6
  • Electronic_ISBN
    1530-1605
  • Type

    conf

  • DOI
    10.1109/HICSS.2010.190
  • Filename
    5428539