Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms

This paper studies the SEU (Single Event Upset) fault for SRAM-based FPGAs. Considering detailed fault behavior on various circuit elements in a post-layout FPGA application, we develop a simulation-based SEU evaluation tool that quantifies fault contribution for each configuration bit. Using this tool and MCNC benchmark circuits, we study the fault characteristics of FPGA circuits and architectures. We show that interconnects not only contribute to the lion share of functional failures, but also have higher failure rate per configuration bit than LUTs. Particularly, multiplexers in local interconnects have the highest failure rate per bit. We find that tuning LUT and cluster sizes helps to reduce the rate (up to 38% in our experiments). In addition, we evaluate two recent fault mitigation algorithms IPD and IPF, which reduce LUT faults by an average of 74% and 15% respectively. But when interconnects are taken into account, the reduction via IPD which considers only LUT faults is merely 6% on chip level. Yet the reduction via IPF which implicitly considers interconnect faults is still around 15%. Therefore, synthesis algorithm should be evaluated with interconnect faults and future algorithms should be developed with consideration of interconnect faults explicitly.