Title :
A 14.5 fJ/cycle/k-gate, 0.33 V ECG processor in 45nm CMOS using statistical error compensation
Author :
Abdallah, Rami A. ; Shanbhag, Naresh R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
A subthreshold ECG processor in IBM 45 nm SOI CMOS is designed to operate at the minimum energy operating point (MEOP). Statistical error compensation (SEC) is employed to further reduce energy (Emin) at the MEOP. SEC is shown to reduce Emin by 28% compared to the conventional (error-free) case while maintaining acceptable beat-detection performance. SEC enables the supply voltage to be scaled to 15% below its critical value at MEOP, while compensating for a 58% pre-correction error rate pe. These results represent an improvement of 19× in beat-detection performance, and 600× in pe over conventional (error-free) systems. The prototype IC consumes 14.5 fJ/cycle/1k-gate and exhibits 4.7× better energy efficiency than the state-of-the-art while tolerating 16× more voltage variations.
Keywords :
CMOS integrated circuits; biomedical electronics; digital signal processing chips; electrocardiography; error compensation; medical signal detection; medical signal processing; silicon-on-insulator; MEOP; SEC; SOI CMOS process; beat detection performance; minimum energy operating point; size 45 nm; statistical error compensation; subthreshold ECG processor; voltage 0.33 V; Electrocardiography; Energy consumption; Error analysis; Error compensation; Measurement uncertainty; Robustness; Timing;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330670