• DocumentCode
    180750
  • Title

    Building trusted ICs using split fabrication

  • Author

    Vaidyanathan, Karthikeyan ; Das, Bishnu Prasad ; Sumbul, Ekin ; Renzhi Liu ; Pileggi, Larry

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2014
  • fDate
    6-7 May 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Due to escalating manufacturing costs the latest and most advanced semiconductor technologies are often available at off-shore foundries. Utilizing these facilities significantly limits the trustworthiness of the corresponding integrated circuits for mission critical applications. We address this challenge of cost-effective and trustworthy CMOS manufacturing for advanced technologies using split fabrication. Split fabrication, the process of splitting an IC into an untrusted and trusted component, enables the designer to exploit the most advanced semiconductor manufacturing capabilities available offshore without disclosing critical IP or system design intent. We show that split fabrication after the Metal1 layer is secure and has negligible performance and area overhead compared to complete IC manufacturing in the off-shore foundry. Measurements from split fabricated 130nm testchips demonstrate the feasibility and efficacy of the proposed approach.
  • Keywords
    CMOS integrated circuits; design for testability; foundries; integrated circuit manufacture; Metal1 layer; area overhead; integrated circuit manufacturing; mission critical integrated circuits; offshore foundries; size 130 nm; split fabrication; test chips; trustworthy CMOS manufacturing; Decision support systems; Hardware design languages; IP networks; Random access memory; Security; System-on-chip; Circuit obfuscation; Design for trust; Hardware security; Split fabrication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Hardware-Oriented Security and Trust (HOST), 2014 IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    978-1-4799-4114-8
  • Type

    conf

  • DOI
    10.1109/HST.2014.6855559
  • Filename
    6855559