• DocumentCode
    180867
  • Title

    Invited Talks

  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Abstract
    Provides an abstract for each of the invited presentations and a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2014 IEEE 23rd Asian
  • Conference_Location
    Hangzhou, China
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2014.12
  • Filename
    6979067