Intensity-noise and frequency-noise measurements in 2 μm Tm-Ho:KYF laser

Author

Galzerano, G. ; Sani, E. ; Toncelli, A. ; Tonelli, M. ; Svelto, C. ; Bava, E. ; Taccheo, S. ; Laporta, P.

Author_Institution

Dipt. di Fisica, Politecnico di Milano, Italy

Volume

3

fYear

2004

fDate

18-20 May 2004

Firstpage

2346

Abstract

The development and characterization of single-mode 2-μm Tm-Ho:KYF₄ (KYF) laser is here presented. In particular, both frequency noise and relative intensity noise measurements of the single-frequency oscillator have been realized. From the power spectral density of the frequency noise an emission linewidth of ∼100 kHz has been measured for the 2 μm source, whereas the intensity noise spectrum is quantum-noise limited for Fourier frequencies higher than 1 MHz.

Keywords

holmium; laser cavity resonators; laser noise; laser tuning; quantum noise; solid lasers; thulium; 2 micron; KYF₄:Tm,Ho; Tm,Ho:KYF₄ laser; frequency noise measurements; laser resonator; power spectral density; quantum-noise limited; relative intensity noise measurements; single-frequency laser oscillator; single-mode laser; solid-state laser; wavelength tunability; Frequency measurement; Laser excitation; Laser noise; Lenses; Mirrors; Optical noise; Optical pumping; Optical resonators; Oscillators; Pump lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE

ISSN

1091-5281

Print_ISBN

0-7803-8248-X

Type

conf

DOI

10.1109/IMTC.2004.1351563

Filename

1351563