DocumentCode
180930
Title
FPGA-Based Subset Sum Delay Lines
Author
Chung-Yun Wang ; Yu-Yi Chen ; Jiun-Lang Huang ; Xuan-Lun Huang
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2014
fDate
16-19 Nov. 2014
Firstpage
287
Lastpage
291
Abstract
The programmable delay line is one of the key components in automatic test equipment. Recently, implementation of programmable delay lines on FPGAs has drawn growing attention due to the flexibility and reconfiguration capability that FPGAs provide. In this work, we propose the subset sum delay line (SSDL) architecture for FPGA-based delay lines. The SSDL architecture takes advantage of the inevitable FPGA process variations, structure irregularities and routing uncertainties to realize high-quality FPGA-based delay lines. Furthermore, compared to previous FPGA-based delay lines, the SSDL architecture is FPGA independent, this substantially enhances its portability across different FPGA generations and suppliers. An SSDL is realized on Alter a Cyclone II FPGA. Measurement results show that it achieves 76 ps resolution and has a dynamic range of 32 ns.
Keywords
automatic test equipment; delay lines; field programmable gate arrays; Altera Cyclone II FPGA; SSDL architecture; automatic test equipment; inevitable process variations; programmable delay lines; structure irregularities; subset sum delay lines; time 32 ns; Delay lines; Delays; Dynamic range; Field programmable gate arrays; Histograms; Routing; ATE; FPGA; programmable delay line; subset sum;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location
Hangzhou
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2014.60
Filename
6979115
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