• DocumentCode
    180930
  • Title

    FPGA-Based Subset Sum Delay Lines

  • Author

    Chung-Yun Wang ; Yu-Yi Chen ; Jiun-Lang Huang ; Xuan-Lun Huang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Firstpage
    287
  • Lastpage
    291
  • Abstract
    The programmable delay line is one of the key components in automatic test equipment. Recently, implementation of programmable delay lines on FPGAs has drawn growing attention due to the flexibility and reconfiguration capability that FPGAs provide. In this work, we propose the subset sum delay line (SSDL) architecture for FPGA-based delay lines. The SSDL architecture takes advantage of the inevitable FPGA process variations, structure irregularities and routing uncertainties to realize high-quality FPGA-based delay lines. Furthermore, compared to previous FPGA-based delay lines, the SSDL architecture is FPGA independent, this substantially enhances its portability across different FPGA generations and suppliers. An SSDL is realized on Alter a Cyclone II FPGA. Measurement results show that it achieves 76 ps resolution and has a dynamic range of 32 ns.
  • Keywords
    automatic test equipment; delay lines; field programmable gate arrays; Altera Cyclone II FPGA; SSDL architecture; automatic test equipment; inevitable process variations; programmable delay lines; structure irregularities; subset sum delay lines; time 32 ns; Delay lines; Delays; Dynamic range; Field programmable gate arrays; Histograms; Routing; ATE; FPGA; programmable delay line; subset sum;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2014 IEEE 23rd Asian
  • Conference_Location
    Hangzhou
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2014.60
  • Filename
    6979115