Title :
The impact of particle desorption on DARHT-II electron beam dynamics
Author :
Davis, H.A. ; Merrill, F.E. ; Moir, D.C. ; Oro, D.M. ; Vermare, C. ; Wood, W.M. ; Elizondo, J.M. ; Hughes, T.P.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
Abstract :
Summary form only given, as follows. It is well known in the intense beam community that when an intense electron beam raises the surface temperature of a solid target (e.g., electrode or aperture) to 300-400 deg C, that loosely bound adsorbed molecules are rapidly released from the surface often followed by speedy ionization. This can lead to adverse beam or diode behavior. Less well known is that even in the absence of heating, electron induced desorption of neutrals or ions can have deleterious effects on beam dynamics. We discuss computer modeling to assess the importance of desorbed particles on beam dynamics, experimental measurements to determine the level of induced desorption, and cleaning techniques to reduce adsorbed molecules on surfaces for the DARHT-II, 2 kA, 20 MeV, 2 /spl mu/s beam.
Keywords :
electron beams; particle beam dynamics; 2 kA; 20 MeV; 300 to 400 C; DARHT-II electron beam dynamics; beam dynamics; cleaning techniques; computer modeling; electron induced desorption; heating; intense beam community; intense electron beam; loosely bound adsorbed molecules; particle desorption; solid target; surface temperature; Apertures; Diodes; Electrodes; Electron beams; Heating; Ionization; Particle beam measurements; Particle beams; Solids; Temperature;
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
DOI :
10.1109/PPPS.2001.961330