• DocumentCode
    180937
  • Title

    Two-Step Dynamic Encoding for Linear Decompressors

  • Author

    Gizdarski, Emil

  • Author_Institution
    Synopsys Inc., Mountain View, CA, USA
  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Firstpage
    330
  • Lastpage
    335
  • Abstract
    In this paper, a new linear decompress or is presented. A specific two-step encoding is incorporated in the implication process to exploit the degree of freedom during ATPG. The proposed decompress or achieves on average 247X test application time reduction for 10 industrial cores. A comparison with multiple seeds per pattern shows that the proposed decompress or achieves higher test application time reduction with fewer test patterns for 7 out of 10 industrial cores.
  • Keywords
    automatic test pattern generation; encoding; ATPG; dynamic encoding; linear decompressors; multiple seeds; Automatic test pattern generation; Encoding; Equations; Flip-flops; Indexes; Mathematical model; Registers; augmented product codes; dynamic compaction; linear decompressors; test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2014 IEEE 23rd Asian
  • Conference_Location
    Hangzhou
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2014.67
  • Filename
    6979122