DocumentCode
180937
Title
Two-Step Dynamic Encoding for Linear Decompressors
Author
Gizdarski, Emil
Author_Institution
Synopsys Inc., Mountain View, CA, USA
fYear
2014
fDate
16-19 Nov. 2014
Firstpage
330
Lastpage
335
Abstract
In this paper, a new linear decompress or is presented. A specific two-step encoding is incorporated in the implication process to exploit the degree of freedom during ATPG. The proposed decompress or achieves on average 247X test application time reduction for 10 industrial cores. A comparison with multiple seeds per pattern shows that the proposed decompress or achieves higher test application time reduction with fewer test patterns for 7 out of 10 industrial cores.
Keywords
automatic test pattern generation; encoding; ATPG; dynamic encoding; linear decompressors; multiple seeds; Automatic test pattern generation; Encoding; Equations; Flip-flops; Indexes; Mathematical model; Registers; augmented product codes; dynamic compaction; linear decompressors; test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location
Hangzhou
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2014.67
Filename
6979122
Link To Document