DocumentCode
1810030
Title
Product metrics for IEC 61131-3 languages
Author
Nair, Amrish
Author_Institution
ABB Corp. Res., Ind. Software Syst., Bangalore, India
fYear
2012
fDate
17-21 Sept. 2012
Firstpage
1
Lastpage
8
Abstract
Quantitative metrics is a key input for improving software development processes. While developing applications using IEC 61131-3 languages, one of the major drawback is unavailability of product metrics. This paper discusses a methodology to define metrics for domain specific languages. Using this methodology, we have defined a set of product metrics that can be used for managing the software project development using IEC 61131-3 languages. We have defined size metrics for these languages using the language specific parameters, which will help the developers for better estimation and tracking the productivity.
Keywords
IEC standards; project management; software development management; software metrics; specification languages; IEC 61131-3 languages; domain specific languages; language specific parameters; product metrics; quantitative metrics; software development process; software project development management;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies & Factory Automation (ETFA), 2012 IEEE 17th Conference on
Conference_Location
Krakow
ISSN
1946-0740
Print_ISBN
978-1-4673-4735-8
Electronic_ISBN
1946-0740
Type
conf
DOI
10.1109/ETFA.2012.6489533
Filename
6489533
Link To Document