• DocumentCode
    1810030
  • Title

    Product metrics for IEC 61131-3 languages

  • Author

    Nair, Amrish

  • Author_Institution
    ABB Corp. Res., Ind. Software Syst., Bangalore, India
  • fYear
    2012
  • fDate
    17-21 Sept. 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Quantitative metrics is a key input for improving software development processes. While developing applications using IEC 61131-3 languages, one of the major drawback is unavailability of product metrics. This paper discusses a methodology to define metrics for domain specific languages. Using this methodology, we have defined a set of product metrics that can be used for managing the software project development using IEC 61131-3 languages. We have defined size metrics for these languages using the language specific parameters, which will help the developers for better estimation and tracking the productivity.
  • Keywords
    IEC standards; project management; software development management; software metrics; specification languages; IEC 61131-3 languages; domain specific languages; language specific parameters; product metrics; quantitative metrics; software development process; software project development management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies & Factory Automation (ETFA), 2012 IEEE 17th Conference on
  • Conference_Location
    Krakow
  • ISSN
    1946-0740
  • Print_ISBN
    978-1-4673-4735-8
  • Electronic_ISBN
    1946-0740
  • Type

    conf

  • DOI
    10.1109/ETFA.2012.6489533
  • Filename
    6489533