Title :
On-chip spectrum analyzer for built-in testing analog ICs
Author :
Méndez-Rivera, M. ; Silva-Martínez, J. ; Sánchez-Sinencio, E.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
An on-chip spectrum analyzer using switched-capacitor techniques is described. This system is used for built-in testing analog circuits. The main property of the proposed architecture is its inherent synchronization, which facilitates the testing task saving time, power and silicon area. Simulations and breadboard results are presented in order to verify the main principles. The resolution of the on-chip spectrum analyzer is limited to 8 bits.
Keywords :
analogue integrated circuits; built-in self test; spectral analysers; switched capacitor networks; synchronisation; analog ICs; built-in testing; on-chip spectrum analyzer; resolution; silicon area; switched-capacitor techniques; synchronization; Analog circuits; Analog-digital conversion; Band pass filters; Circuit testing; Clocks; Frequency synchronization; Frequency synthesizers; Sampling methods; Spectral analysis; Switched capacitor circuits;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010640
