DocumentCode :
1811360
Title :
The Effects of Intense RF Pulses on Electronic Circuits and Systems - A New University Center-of-Excellence
Author :
Witt, G.L.
fYear :
2001
fDate :
17-22 June 2001
Firstpage :
566
Abstract :
Summary form only given. Recently, attention has been drawn to the potential threat posed to electronic systems by exposure to intense RF pulses. Such exposure could be inadvertent or deliberate. As an example of the latter, compact, crude high power microwave sources might be used to target communication systems, computers, vehicles, or security systems with the intent of interrupting, halting, or otherwise interfering with government and/or business operations. While concepts of high power microwave (HPM) weapons continue to receive intense study, models that accurately predict the effects of HPM on electronic circuits and systems remain elusive. A new university program is being formed under the DoD MURI (Multi-Disciplinary University Research Initiative) program to address many of these issues. Such programs typically engage researchers from several technical fields, often couple multiple universities, are funded at roughly $1 M per year and last 3-5 years. Topics of interest include: (1) pulse shape and modulation effects on system coupling; (2) nonlinear interactions such as breakdown and arcing; (3) effects on the temperature of circuit junctions; (4) timing and clock state effects; (5) statistical properties of upset and disruption; (6) magnetic effects on non-volatile memories; (7) nonlinear control and chaos in circuits; (8) multiple, simultaneous failure mode synergies; (9) short-pulse, high repetition rate, low-energy-per-pulse effects; (10) design of experiments and related methodological issues. An integrated program has been designed to address the dominant features of selected topics in both ultra-wide band and narrow-band RF interactions and effects, and the modeling of effects based upon fundamental principles. The program will be strongly coupled to related government and industry projects. The new MURI is expected to begin shortly after the conference. Details of the plans for this MURI project will be described.
Keywords :
electromagnetic pulse; radiofrequency interference; weapons; arcing; breakdown; business operations; chaos; circuit junctions; clock state effects; communication systems; computers; electronic circuits; electronic systems; government; high power microwave sources; high power microwave weapons; intense RF pulse effects; modulation effects; multiple simultaneous failure mode synergies; nonlinear control; nonlinear interactions; nonvolatile memories; pulse shape; security systems; short-pulse high repetition rate low energy per pulse effects; system coupling; timing; vehicles; Communication system security; Coupling circuits; Electronic circuits; Government; Magnetic circuits; Pulse circuits; Pulse modulation; Radio frequency; Shape control; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
Type :
conf
DOI :
10.1109/PPPS.2001.961400
Filename :
961400
Link To Document :
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