• DocumentCode
    1815678
  • Title

    Towards a sensorless current and temperature monitoring in MOSFET-based H-bridge

  • Author

    Cyril, Buttay ; Dominique, Bergogne ; Herv, M. ; Bruno, Allard ; René, Ehlinger ; Pascal, Bevilacqua

  • Author_Institution
    CEGELY-INSA, Lyon, France
  • Volume
    2
  • fYear
    2003
  • fDate
    15-19 June 2003
  • Firstpage
    901
  • Abstract
    Chip temperature in power MOSFETs is commonly obtained (e.g. for thermal characterisation purposes) by feeding a known, controlled low DC-current in the body diode and measuring the forward-voltage drop. Drain current might be estimated by a voltage measurement across drain and source terminals, on-state resistance acting as a shunt, assuming that the temperature is known and constant. Such voltage-based measurements are attractive, but dependencies limit their application to laboratory environment. In industrial converters, neither temperature nor current are known a priori. Here we show that by combining the two techniques, previous limitations are overcome. Temperature and current come as two separate polynomial expressions. The application to a low-cost monitoring system is presented and results are discussed. The validity of the system over the full temperature and current ranges is verified and a confidence map is given.
  • Keywords
    bridge circuits; electric current control; electric current measurement; invertors; monitoring; polynomials; power MOSFET; power semiconductor diodes; temperature measurement; voltage measurement; 100 A; 75 V; MOSFET-based H-bridge; chip temperature; confidence map; controlled low DC-current; diode; drain current; drain source voltage measurement; drain terminals; forward-voltage drop measurement; inverter; low-cost monitoring system; on-state resistance; parameter estimation; polynomial expressions; power MOSFET; sensorless current monitoring; sensorless temperature monitoring; source terminals; thermal characterisation; Diodes; Electrical resistance measurement; MOSFETs; Power measurement; Semiconductor device measurement; Sensorless control; Temperature control; Temperature measurement; Temperature sensors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialist Conference, 2003. PESC '03. 2003 IEEE 34th Annual
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-7754-0
  • Type

    conf

  • DOI
    10.1109/PESC.2003.1218175
  • Filename
    1218175