DocumentCode
1815862
Title
Multi-resolution Abnormal Trace Detection Using Varied-length N-grams and Automata
Author
Jiang, Guofei ; Chen, Haifeng ; Ungureanu, Cristian ; Yoshihira, Kenji
Author_Institution
NEC Labs., Princeton, NJ
fYear
2005
fDate
13-16 June 2005
Firstpage
111
Lastpage
122
Abstract
Detection and diagnosis of faults in a large-scale distributed system is a formidable task. Interest in monitoring and using traces of user requests for fault detection has been on the rise recently. In this paper we propose novel fault detection methods based on abnormal trace detection. One essential problem is how to represent the large amount of training trace data compactly as an oracle. Our key contribution is the novel use of varied-length n-grams and automata to characterize normal traces. A new trace is compared against the learned automata to determine whether it is abnormal. We develop algorithms to automatically extract n-grams and construct multiresolution automata from training data. Further both deterministic and multihypothesis algorithms are proposed for detection. We inspect the trace constraints of real application software and verify the existence of long n-grams. Our approach is tested in a real system with injected faults and achieves good results in experiments
Keywords
automata theory; deterministic algorithms; fault diagnosis; large-scale systems; learning (artificial intelligence); program diagnostics; software fault tolerance; deterministic algorithm; fault detection; fault diagnosis; fault injection; large-scale distributed system; learned automata; multihypothesis algorithm; multiresolution abnormal trace detection; trace constraints; user requests; varied-length n-grams; Application software; Data mining; Fault detection; Fault diagnosis; Large-scale systems; Learning automata; Monitoring; Multiresolution analysis; System testing; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Autonomic Computing, 2005. ICAC 2005. Proceedings. Second International Conference on
Conference_Location
Seattle, WA
Print_ISBN
0-7965-2276-9
Type
conf
DOI
10.1109/ICAC.2005.42
Filename
1498057
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