Title :
JFET transistors for low noise applications at low frequency
Author :
Arnaboldi, Claudio ; Boella, Giuliano ; Panzeri, Emanuele ; Pessina, Gianluigi
Author_Institution :
Dipt. di Fisica, Universita di Milano Bicocca, Italy
Abstract :
We describe an instrument capable to perform very accurate automatic noise measurements at low frequency. This way we have been able to study and select JFET transistors to be used for the readout of bolometric detectors. Design criteria and adequate biasing condition allowed to reach outstanding results in term of noise and power dissipation.
Keywords :
bolometers; junction gate field effect transistors; nuclear electronics; semiconductor device noise; JFET transistors; bolometric detectors; low frequency; low noise applications; Aluminum; Bolometers; Cryogenics; Detectors; Engine cylinders; Frequency; Low-frequency noise; Noise measurement; Steel; Temperature;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
Print_ISBN :
0-7803-8257-9
DOI :
10.1109/NSSMIC.2003.1351910
