• DocumentCode
    1817128
  • Title

    A planar type EEPROM cell structure by standard CMOS process for integration with gate array, standard cell, microprocessor and for neural chips

  • Author

    Ohsaki, Katsuhiko ; Asamoto, Noriaki ; Takagaki, Shunichi

  • Author_Institution
    IBM Japan, Shiga-ken, Japan
  • fYear
    1993
  • fDate
    9-12 May 1993
  • Abstract
    A planar-type EEPROM (electrically erasable programmable read-only memory) cell structure which consists of adjacently NMOS and PMOS transistors with an electrically isolated common polysilicon gate has been prepared by a standard CMOS process (no ultrathin oxide, no stacking of floating and control gates). Five to ten volt shifts of threshold and more than thousands of cycles of endurance are obtained. This EEPROM cell can be easily integrated with gate array, standard cell, microprocessor LSIs. It can store analog data and be applied to neural chips
  • Keywords
    EPROM; ASIC; NMOS transistors; PMOS transistors; analog data memory; common polysilicon gate; endurance characteristics; gate array; integration; microprocessor; neural chips; planar type EEPROM cell structure; standard CMOS process; standard cell; threshold voltage shifts; CMOS process; Channel hot electron injection; Control systems; EPROM; MOS devices; MOSFETs; Microprocessors; Neural network hardware; Tunneling; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0826-3
  • Type

    conf

  • DOI
    10.1109/CICC.1993.590759
  • Filename
    590759