DocumentCode :
1817128
Title :
A planar type EEPROM cell structure by standard CMOS process for integration with gate array, standard cell, microprocessor and for neural chips
Author :
Ohsaki, Katsuhiko ; Asamoto, Noriaki ; Takagaki, Shunichi
Author_Institution :
IBM Japan, Shiga-ken, Japan
fYear :
1993
fDate :
9-12 May 1993
Abstract :
A planar-type EEPROM (electrically erasable programmable read-only memory) cell structure which consists of adjacently NMOS and PMOS transistors with an electrically isolated common polysilicon gate has been prepared by a standard CMOS process (no ultrathin oxide, no stacking of floating and control gates). Five to ten volt shifts of threshold and more than thousands of cycles of endurance are obtained. This EEPROM cell can be easily integrated with gate array, standard cell, microprocessor LSIs. It can store analog data and be applied to neural chips
Keywords :
EPROM; ASIC; NMOS transistors; PMOS transistors; analog data memory; common polysilicon gate; endurance characteristics; gate array; integration; microprocessor; neural chips; planar type EEPROM cell structure; standard CMOS process; standard cell; threshold voltage shifts; CMOS process; Channel hot electron injection; Control systems; EPROM; MOS devices; MOSFETs; Microprocessors; Neural network hardware; Tunneling; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0826-3
Type :
conf
DOI :
10.1109/CICC.1993.590759
Filename :
590759
Link To Document :
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