DocumentCode
1817267
Title
Depth of Anesthesia Index using Cumulative Power Spectrum
Author
Jospin, M. ; Caminal, P. ; Jensen, E.W. ; Vallverdu, M. ; Struys, M.M.R.F. ; Vereecke, H.E.M. ; Kaplan, D.T.
Author_Institution
Tech. Univ. of Catalonia, Barcelona
fYear
2007
fDate
22-26 Aug. 2007
Firstpage
15
Lastpage
18
Abstract
Over the last ten years, monitors of depth of anesthesia have progressively been integrated in the clinical practice. Based on the analysis of the electroencephalogram (EEG), these monitors deliver an index that helps the anesthesiologist to determine the state of the patient during the surgery. Although they employ different kind of algorithms, spectral parameters are always taken into account to achieve the final indexes. In this work, a new spectral parameter based on the cumulative power spectrum is proposed. When compared to the Spectral Edge Frequency (SEF), a classic spectral parameter, the Cumulative Power Spectrum Index (CPSI) presents a higher correlation with reference indexes (AAI, BIS and CePROP) and a higher prediction probability of the state of the patient. Furthermore, when compared to the reference indexes, the CPSI shows similar performances in terms of correlation and presents a higher prediction probability than two of them (BIS and CePROP).
Keywords
bioelectric phenomena; drugs; electroencephalography; medical signal processing; neurophysiology; patient monitoring; probability; spectral analysis; surgery; EEG; anesthesia index monitoring; cumulative power spectrum index; electroencephalogram; prediction probability; spectral edge frequency; spectral parameter; surgery; Anesthesia; Biomedical monitoring; Databases; Drugs; Electroencephalography; Entropy; Frequency; Hospitals; Patient monitoring; Surgery; Anesthesia, General; Databases, Factual; Electroencephalography; Humans; Monitoring, Intraoperative;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location
Lyon
ISSN
1557-170X
Print_ISBN
978-1-4244-0787-3
Type
conf
DOI
10.1109/IEMBS.2007.4352211
Filename
4352211
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