• DocumentCode
    1817588
  • Title

    Multi-resolution parallel integral projection for fast localization of a straight electrode in 3D ultrasound images

  • Author

    Uhercik, Marian ; Kybic, Jan ; Liebgott, Herve ; Cachard, Christian

  • Author_Institution
    Center for Machine Perception, Czech Tech. Univ. in Prague, Prague
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    33
  • Lastpage
    36
  • Abstract
    We address the problem of fast and accurate localization of miniature surgical instruments like needles or electrodes using 3D ultrasound (US). An algorithm based on maximizing a parallel integral transform (PIP) can automatically localize line-shaped objects in 3D US images with accuracy on the order of hundreds of micrometers. Here we propose to use a multi-resolution to accelerate the algorithm significantly. We use a maximum function for downsampling to preserve the high intensity voxels of a thin electrode. We integrate the multi-resolution pyramid into a hierarchical mesh-grid search of PIP. The experiments with a tissue mimicking phantom and breast biopsy data show that proposed method works well on real US images. The speed-up is threefold compared to original PIP method with the same accuracy 0.4 mm. A further speed-up up to 16 times is reached by an early stopping of the optimization, at the expense of some loss of accuracy.
  • Keywords
    biological tissues; biology computing; biomedical electrodes; biomedical ultrasonics; mammography; phantoms; 3D ultrasound images; breast biopsy; multiresolution parallel integral projection; straight electrode; thin electrode; tissue mimicking phantom; Acceleration; Breast biopsy; Electrodes; Imaging phantoms; Needles; Parameter estimation; Polynomials; Principal component analysis; Surgical instruments; Ultrasonic imaging; 3D ultrasound; electrode; localization; multi-resolution; parallel integral projection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4540925
  • Filename
    4540925