• DocumentCode
    1817684
  • Title

    Impact of soft error challenge on SoC design

  • Author

    Zorian, Y. ; Vardanian, V.A. ; Aleksanyan, K. ; Amirkhanyan, K.

  • Author_Institution
    Virage Logic Corp., Fremont, CA, USA
  • fYear
    2005
  • fDate
    6-8 July 2005
  • Firstpage
    63
  • Lastpage
    68
  • Abstract
    Soft errors are a major challenge to robust design. Conventionally, designs with high level requirements for reliability and availability required protection against soft errors. However, the scaling level reached with today´s nanometer technologies is moving the soft error protection requirements to SoC designs for a wide range of applications. This paper discusses the soft error challenge, its implication on SoC design practices and possible approaches to create a robust SoC design.
  • Keywords
    integrated circuit design; nanotechnology; radiation effects; system-on-chip; SoC design; nanometer technologies; scaling level; soft error protection requirements; system-on-chip; CMOS logic circuits; CMOS process; CMOS technology; Combinational circuits; Integrated circuit technology; Latches; Protection; Robustness; Sequential circuits; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
  • Print_ISBN
    0-7695-2406-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2005.36
  • Filename
    1498130