DocumentCode
1817684
Title
Impact of soft error challenge on SoC design
Author
Zorian, Y. ; Vardanian, V.A. ; Aleksanyan, K. ; Amirkhanyan, K.
Author_Institution
Virage Logic Corp., Fremont, CA, USA
fYear
2005
fDate
6-8 July 2005
Firstpage
63
Lastpage
68
Abstract
Soft errors are a major challenge to robust design. Conventionally, designs with high level requirements for reliability and availability required protection against soft errors. However, the scaling level reached with today´s nanometer technologies is moving the soft error protection requirements to SoC designs for a wide range of applications. This paper discusses the soft error challenge, its implication on SoC design practices and possible approaches to create a robust SoC design.
Keywords
integrated circuit design; nanotechnology; radiation effects; system-on-chip; SoC design; nanometer technologies; scaling level; soft error protection requirements; system-on-chip; CMOS logic circuits; CMOS process; CMOS technology; Combinational circuits; Integrated circuit technology; Latches; Protection; Robustness; Sequential circuits; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN
0-7695-2406-0
Type
conf
DOI
10.1109/IOLTS.2005.36
Filename
1498130
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