Automated development of test program sets for analog circuit modules

A system for automatically generating test program sets for analog circuit modules is proposed. The aim is to use artificial intelligence techniques to capture the approach used by experienced test engineers. The circuit is described in terms of functional units consisting of groups of components which have some higher function in the circuit module. Knowledge of the characteristics of each type of functional unit is stored in a library. This information allows propagation of signals and error tolerances for use in simulation of the circuit. In addition, the knowledge for each functional unit type includes a list of faults to be detected, test strategies for detecting those faults, and heuristics for working backwards through the circuit to obtain signals required for a local test strategy