Title :
Embedded OTP fuse in CMOS logic process
Author :
Lin, Ching-Yuan ; Lin, Chung-Hung ; Ho, Chien-Hung ; Liao, Wei-Wu ; Lee, Shu-Yueh ; Ho, Ming-Chou ; Wang, Shih-Chen ; Huang, Shih-Chan ; Lin, Yuan-Tai ; Hsu, Charles Ching-Hsiang
Author_Institution :
eMemory Technol. Incorporation, Hsinchu, Taiwan
Abstract :
This paper presents the embedded OTP fuse in standard CMOS logic compatible process without additional mask. The embedded OTP fuse can be programmed in 100μs per byte and be accessed in 6ns for 32 bits at once. The 32-bit OTP fuse takes less than 0.0085mm 2 in 0.25μm CMOS process and has 10-year data retention at 85°C.
Keywords :
CMOS logic circuits; embedded systems; random-access storage; 0.25 micron; 10 yrs; 100 mus; 6 ns; 85 C; CMOS logic process; data retention; embedded OTP fuse; CMOS logic circuits; CMOS process; Costs; Electrons; Fuses; Latches; MOS devices; MOSFETs; Nonvolatile memory; Threshold voltage;
Conference_Titel :
Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on
Conference_Location :
Taipei
Print_ISBN :
0-7695-2313-7
DOI :
10.1109/MTDT.2005.22
