Title :
Simple Techniques for Correcting Multiport S-Parameter Data Measured with a Two-Port Network Analyzer
Author :
Rautio, James C.
Author_Institution :
GENERAL ELECTRIC COMPANY, SYRACUSE, NEW YORK
Keywords :
Electric variables measurement; Scattering parameters;
Conference_Titel :
ARFTG Conference Digest-Spring, 19th ARFTG
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1982.323491
