• DocumentCode
    1820394
  • Title

    Low-noise CMOS preamplifier-shaper for silicon drift detectors

  • Author

    Gramegna, G. ; O´Connor, P. ; Rehak, P. ; Hart, S.

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    346
  • Abstract
    We have designed a 16-channel preamplifier-shaper for particle tracking using silicon drift detectors (SDD). The preamplifier, which is optimized for a detector capacitance of 0.2-0.8 pF, uses two new circuit techniques to achieve a low noise (ENC 120 e-+62 e-/pF), high linearity (<0.5% to 50 fC), and good tolerance to process variations and temperature and power supply fluctuations. The circuit is continuously sensitive, has no digital signals on chip, and requires no external components or critical adjustments. The peaking time of the shaper is 50 nsec and the power dissipation, including an off-chip driver, is 6.5 mW/channel. The circuit is fabricated in 1.2 μm CMOS and can accommodate detector leakage currents of up to 1.5 μA. Although the circuit was developed for use with particle tracking detectors, these techniques are also well-suited for the design of lower-noise preamplifiers for high-resolution X-ray spectroscopy systems
  • Keywords
    CMOS digital integrated circuits; X-ray detection; X-ray spectrometers; detector circuits; drift chambers; nuclear electronics; preamplifiers; pulse shaping circuits; silicon radiation detectors; 0.2 to 0.8 pF; 1.5 muA; 16-channel preamplifier-shaper; Si; Si drift detectors; circuit techniques; detector leakage currents; high-resolution X-ray spectroscopy; low-noise CMOS preamplifier-shaper; particle tracking; peaking time; power dissipation; power supply fluctuations; process variations; temperature fluctuations; Capacitance; Circuit noise; Detectors; Linearity; Noise shaping; Particle tracking; Power supplies; Preamplifiers; Silicon; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.590985
  • Filename
    590985