Title :
Performance comparison of VLV, ULV, and ECR tests [biomedical IC product]
Author :
Jiang, Wanli ; Peterson, Eric
Author_Institution :
Test Eng., Guidant Corp., St. Paul, MN, USA
Abstract :
Very-Low-Voltage, Ultra-Low-Voltage (a modified version of Minimum-Voltage), and Energy Consumption Ratio (a recently developed test metric) tests are applied as supplemental tests along with existing traditional tests to a biomedical IC product. The effectiveness and efficiency of these supplemental tests are evaluated and compared with some major traditional tests. The effectiveness analysis indicates that Ultra-Low-Voltage and Energy Consumption Ratio tests identified potentially defective devices from good devices. The efficiency analysis shows that the Energy Consumption Ratio test is much more efficient than Very-Low-Voltage, Ultra-Low-Voltage and major traditional tests.
Keywords :
biomedical electronics; fault diagnosis; integrated circuit testing; low-power electronics; production testing; prosthetics; biomedical IC product; defective device identification; efficiency analysis; energy consumption ratio tests; high quality IC products; implantable biomedical devices; supplemental tests; ultra-low-voltage tests; very-low-voltage tests; Biomedical engineering; Circuit faults; Circuit testing; Current measurement; Energy consumption; Integrated circuit testing; Logic testing; Manufacturing; Power engineering and energy; Voltage;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011107
