Title :
Artificial intelligence: fighting the wrong battle? [Electronic equipment diagnosis]
Author :
De Mare, Gregory ; Longendorfer, Betsy
Author_Institution :
Giordano Associates Inc., Pine Brook, NJ, USA
Abstract :
Problems encountered when applying artificial intelligence (AI) techniques to the diagnosis of electronic equipment are identified, and an approach to building a useful AI diagnostic tool is given. An outline of the system architecture, which will support the more sophisticated and data-intensive needs associated with automation, is given. Improvements to existing development tools for AI diagnostic capabilities are also described
Keywords :
artificial intelligence; automatic testing; computer architecture; development systems; electronic equipment testing; expert systems; software tools; AI; artificial intelligence; development tools; diagnosis of electronic equipment; system architecture; Art; Artificial intelligence; Automatic testing; Automation; Circuit testing; Costs; Diagnostic expert systems; Electronic equipment; Knowledge based systems; Test equipment;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9620
