Title :
A successful DFT tester: what will it look like? is revolution in test approaches required?
Author :
Song, Lee ; Garcia, Rudy ; Levy, Andrew ; Wheater, Don
Author_Institution :
Teradyne
fDate :
April 28 2002-May 2 2002
Keywords :
Built-in self-test; Costs; Design for testability; Design methodology; Electronics industry; Fires; Production; Semiconductor device testing; Signal design; Silicon;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011116
