DocumentCode :
1821171
Title :
Test as a key enabler for faster yield ramp-up
Author :
Segal, Julie ; Segers, Rene
Author_Institution :
HPL
fYear :
2002
fDate :
April 28 2002-May 2 2002
Firstpage :
177
Lastpage :
177
Keywords :
Automatic testing; Computerized monitoring; Failure analysis; Inspection; Integrated circuit testing; Life testing; Manufacturing processes; Random access memory; Semiconductor device testing; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7695-1570-3
Type :
conf
DOI :
10.1109/VTS.2002.1011135
Filename :
1011135
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1821171
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