Title :
Speeding up the Byzantine fault diagnosis using symbolic simulation
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine General´s phenomenon, in which a fault manifests itself as a non-logical voltage level at the fault site. Previously, explicit enumeration was suggested to deal with such a problem. However, it is often too time-consuming because the CPU time is exponentially proportional to fanout degree of the circuit under diagnosis. To speed up this process, we present an implicit enumeration technique using symbolic simulation. Experimental results show that the CPU time can be improved by several orders of magnitude for ISCAS85 benchmark circuits.
Keywords :
CMOS logic circuits; binary decision diagrams; combinational circuits; fault diagnosis; fault simulation; integrated circuit testing; logic testing; symbol manipulation; Byzantine fault diagnosis; Byzantine general phenomenon; Byzantine stuck-open faults; CMOS logic circuit; CPU time improvement; ISCAS85 benchmark circuits; combinational circuits; fanout degree; implicit enumeration technique; logic IC; nonlogical voltage level; ordered binary decision diagram; symbolic simulation; Cause effect analysis; Central Processing Unit; Circuit faults; Circuit simulation; Dictionaries; Fault diagnosis; Logic gates; Manufacturing; Silicon; Voltage;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011138