DocumentCode :
1821253
Title :
Experiments on X-Band Automatic Impedance Measuring Scheme Using Three Fixed Probes
Author :
Chia-Lun J. Hu
Author_Institution :
Electrical Sciences and Systems Engineering, Southern Illinois University, Carbondale, IL 62901
Volume :
2
fYear :
1982
fDate :
Nov. 1982
Firstpage :
98
Lastpage :
98
Keywords :
Diodes; Displays; Electric variables measurement; Impedance measurement; NIST; Oscilloscopes; Probes; Process design; Real time systems; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 20th ARFTG
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1982.323530
Filename :
4118921
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1821253
بازگشت