DocumentCode :
1821275
Title :
On-chamber readout system for the ATLAS MDT Muon Spectrometer
Author :
Chapman, John ; Arai, Yasuo ; Ball, Robert ; Brandenburg, George ; Hazen, Eric ; Oliver, John ; Posch, Christoph
Author_Institution :
Michigan Univ., Ann Arbor, MI, USA
Volume :
1
fYear :
2003
fDate :
19-25 Oct. 2003
Firstpage :
454
Abstract :
The ATLAS MDT Muon Spectrometer is a system of approximately 380,000 pressurized cylindrical drift tubes of 3 cm diameter and up to 6 meters in length. These Monitored Drift Tubes (MDTs) are precision-glued to form super-layers, which in turn are assembled into precision chambers of up to 432 tubes each. Each chamber is equipped with a set of mezzanine cards containing analog and digital readout circuitry sufficient to read out 24 MDTs per card. Up to 18 of these cards are connected to an on-chamber DAQ element referred to as a Chamber Service Module, or CSM. The CSM multiplexes data from the mezzanine cards and outputs this data on an optical fiber which is received by the off-chamber DAQ system. Thus, the chamber forms a highly self-contained unit with DC power in and a single optical fiber out. The Monitored Drift Tubes, due to their length, require a terminating resistor at their far end to prevent reflections. The readout system has been designed so that thermal noise from this resistor remains the dominant noise source of the system. This level of noise performance has been achieved and maintained in large scale on-chamber tests.
Keywords :
drift chambers; field programmable gate arrays; muon detection; nuclear electronics; particle spectrometers; readout electronics; ATLAS MDT Muon Spectrometer; Monitored Drift Tubes; analog readout circuitry; digital readout circuitry; mezzanine cards; noise performance; on-chamber readout system; pressurized cylindrical drift tubes; Assembly; Circuits; Data acquisition; Mesons; Monitoring; Optical fibers; Optical noise; Optical reflection; Resistors; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8257-9
Type :
conf
DOI :
10.1109/NSSMIC.2003.1352082
Filename :
1352082
Link To Document :
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