Title :
Approximating infinite dynamic behavior for DRAM cell defects
Author :
AL-Ars, Zaid ; Van de Goor, Ad J.
Author_Institution :
Sect. of Comput. Eng., Delft Univ. of Technol., Netherlands
Abstract :
Analyzing the dynamic faulty behavior in DRAMs is a severely time consuming task, because of the exponential growth of the analysis time needed with each memory operation added to the sensitizing operation sequence of the fault. In this paper, a new fault analysis approach for DRAM cell defects is presented where the total infinite space of dynamic faulty behavior can be approximated within a limited amount of analysis time. The paper also presents the analysis results for some cell defects using the new approach, in combination with detection conditions that guarantee the detection of any detectable dynamic faults in the defective cell.
Keywords :
DRAM chips; circuit simulation; fault diagnosis; integrated circuit testing; DRAM cell defects; defect simulation; dynamic fault; functional fault models; infinite dynamic behavior; memory testing; Analytical models; Fault detection; Information analysis; Information technology; Logic; Random access memory; Resource description framework; Taxonomy; Testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE
Print_ISBN :
0-7695-1570-3
DOI :
10.1109/VTS.2002.1011171