DocumentCode :
1822074
Title :
Phase contrast image segmentation by weak watershed transform assembly
Author :
Debeir, Olivier ; Adanja, I. ; Warzee, Nadine ; Van Ham, P. ; Decaestecker, Christine
Author_Institution :
Lab. of Image Synthesis & Anal., Univ. Libre de Bruxelles, Brussels
fYear :
2008
fDate :
14-17 May 2008
Firstpage :
724
Lastpage :
727
Abstract :
We present here a method giving a robust segmentation for in vitro cells observed under standard phase-contrast microscopy. We tackle the problem using the watershed transform. Watershed transform is known for its ability to generate closed contours and its extreme sensitivity to image borders. One main drawback of this method is over- segmentation. In order to circumvent this, marked watershed based on the "modified gradient" method has been developed. However, the choice of the watershed mark locations is critical and their inadequacy may cause wrong results. Similarly to randomization and combination procedures used in the machine learning field, the present paper promotes the use of an assembly of marked watershed transforms, in order to increase the segmentation robustness. This results in the definition of candidate segmentations margins (expressed in terms of object border confidence) from which final segmentation can be chosen by means of thresholding.
Keywords :
cellular biophysics; image segmentation; mathematical morphology; medical image processing; pattern classification; in vitro cells; machine learning field; marked watershed transform; modified gradient method; phase contrast image segmentation; phase-contrast microscopy; segmentation robustness; watershed mark location; weak watershed transform assembly; Assembly; Image generation; Image segmentation; In vitro; Laboratories; Machine learning; Microscopy; Morphology; Pixel; Robustness; Classifier assembly; Image segmentation; Mathematical morphology; Medical image processing; Pattern classification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
Type :
conf
DOI :
10.1109/ISBI.2008.4541098
Filename :
4541098
Link To Document :
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