DocumentCode
182229
Title
Backscattered electrons from X-ray target
Author
Thuc Bui ; Hart, D. ; Ives, R. Lawrence
Author_Institution
Calabazas Creek Res. Inc., Mountain View, CA, USA
fYear
2014
fDate
22-24 April 2014
Firstpage
81
Lastpage
82
Abstract
X-rays are radiated from a target when an electron beam is accelerated and collides it. When high energy electrons struck a metal target, significant backscattered electrons could be generated and reduce the image sharpness. This paper will describe the Monte Carlo algorithm to analyze backscattered electrons in Beam Optics Analyzer (BOA) and present simulation results of an X-ray tube. The results will be compared with experimental data.
Keywords
Monte Carlo methods; X-ray production; X-ray tubes; electron backscattering; Monte Carlo algorithm; X-ray target; X-ray tube; backscattered electrons; beam optics analyzer; high energy electrons; image sharpness; metal target; Anodes; Electron beams; Monte Carlo methods; Optical beams; Optics; Scattering; X-ray imaging; BOA; Beth Stopping power; Monte Carlo; Rutherford Scattering; X-ray; backscattered; beam optics; electron beam;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, IEEE International
Conference_Location
Monterey, CA
Type
conf
DOI
10.1109/IVEC.2014.6857500
Filename
6857500
Link To Document