Title :
Planar Impedance Standards and Accuracy Considerations in Vector Network Analysis
Author_Institution :
Cascade Microtech, Inc.
Abstract :
An equation is given for theoretical errors in oneport corrected vector S-parameter measurements (in any transmission media). The error analysis is used to investigate parasitics peculiar to planar impedance standards. Experimental results verify the error analysis, and show that parasitics as small as 5 pH are repeatably measurable. Application to GaAsFET measurements through 26 GHz is discussed.
Keywords :
Error analysis; Impedance; Integrated circuit measurements; MMICs; Measurement standards; Microwave integrated circuits; Microwave theory and techniques; Reflection; Scattering parameters; Transmission line measurements;
Conference_Titel :
ARFTG Conference Digest-Spring, 27th ARFTG
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1986.323671
