DocumentCode
1825396
Title
Estimation of cortical multivariate autoregressive models for EEG/MEG using an expectation-maximization algorithm
Author
Cheung, B.L.P. ; Van Veen, Barry D.
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI
fYear
2008
fDate
14-17 May 2008
Firstpage
1235
Lastpage
1238
Abstract
A new method for estimating multivariate autoregressive (MVAR) models of cortical connectivity from surface EEG or MEG measurements is presented. Conventional approaches to this problem first attempt to solve the inverse problem to estimate cortical signals and then fit an MVAR model to the estimated signals. Our new approach expresses the measured data in tens of a hidden state equation describing MVAR cortical signal evolution and an observation equation that relates the hidden state to the surface measurements. We develop an expectation-maximization (EM) algorithm to find maximum likelihood estimates of the MVAR model parameters. Simulations show that this one-step approach performs significantly better than the conventional two-step approach at estimating the cortical signals and detecting functional connectivity between different cortical regions.
Keywords
autoregressive processes; electroencephalography; expectation-maximisation algorithm; magnetoencephalography; medical signal detection; medical signal processing; MEG; cortical connectivity; cortical multivariate autoregressive model; cortical signal evolution; expectation-maximization algorithm; inverse problem; maximum likelihood estimation; surface EEG measurement; Brain modeling; Electric variables measurement; Electroencephalography; Equations; Expectation-maximization algorithms; Inverse problems; Maximum likelihood detection; Maximum likelihood estimation; Signal processing; Surface fitting; Cortical connectivity; Expectation-maximization algorithm; Granger causality; multivariate autoregressive model; partial directed coherence;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-2002-5
Electronic_ISBN
978-1-4244-2003-2
Type
conf
DOI
10.1109/ISBI.2008.4541226
Filename
4541226
Link To Document