Title :
“In system” transparent autodiagnostics of RAMs
Author :
Sosnowski, Janusz
Author_Institution :
Inst. of Comput. Sci., Warsaw Univ. of Technol., Poland
Abstract :
In this paper we present an original technique of testing classical RAMs (without BIST) in real system environment. The developed testing methodology allows to cover a large class of faults including pattern sensitivity and dynamic faults. An important feature of the presented approach is test transparency which assures that at the end of the test the contents of the RAM are equal to its initial contents (before testing). This technique is especially useful for periodic autodiagnostic procedures in embedded and multiprocessor systems. It has been also extended for cache and dual port RAMs
Keywords :
automatic testing; cache storage; fault diagnosis; logic testing; random-access storage; real-time systems; RAMs; cache storage; dual port RAMs; dynamic faults; in-system diagnostics; multiprocessor systems; pattern sensitivity; periodic autodiagnostic procedures; real system environment; test transparency; transparent autodiagnostics; Built-in self-test; Cache memory; Circuit faults; Circuit testing; Multiprocessing systems; Performance evaluation; Random access memory; Read only memory; Read-write memory; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470618
