Title :
Highly reliable carbon nanotube field emitters for vacuum electronic devices
Author :
Jae-Woo Kim ; Sungyoul Choi ; Jun-Tae Kang ; Jin-Woo Jeong ; Seungjoon Ahn ; Yoon-Ho Song
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
We fabricated highly reliable carbon nanotube (CNT) field emitters and evaluated their performances in a harsh environment of a tiny vacuum-sealed vessel for vacuum electronic devices. The CNT paste was formulated by using a ball-milling method with optimized fillers for high-temperature endurance of the resultant field emitters. The CNT field emitters in a triode configuration showed reliable operation for over 150 h at a high current density of 0.4 A/cm2.
Keywords :
carbon nanotubes; nanotube devices; vacuum microelectronics; CNT field emitters; CNT paste; ball-milling method; current density; high-temperature endurance; highly-reliable carbon nanotube field emitters; optimized fillers; resultant field emitters; triode configuration; vacuum electronic devices; vacuum-sealed vessel; Anodes; Carbon nanotubes; Logic gates; Materials; Reliability engineering; Vacuum technology; brazing; carbon nanotube; electron sources; field emission; vacuum devices;
Conference_Titel :
Vacuum Electronics Conference, IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IVEC.2014.6857720
