DocumentCode
1826533
Title
Design-for-testability economics
Author
Thatcher, Carl W.
fYear
1993
fDate
17-21 Oct 1993
Firstpage
590
Abstract
The need for design for testability (DFT) in mixed-signal boards and systems is becoming more significant as the miniaturization and superintegration trends continue. Accessibility to critical nodes of the circuits is required in order to meet the demands for higher quality, lower cost, shorter time to market, continuous improvement and standardization. However, we must be prudent in the way we address these demands, especially during the development of the P1149.4 Mixed-Signal Standard, in order to insure the appropriate balance
Keywords
Circuit testing; Consumer electronics; Costs; Design engineering; Design for testability; Electronic equipment testing; Process design; Standardization; System testing; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470650
Filename
470650
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