• DocumentCode
    1826533
  • Title

    Design-for-testability economics

  • Author

    Thatcher, Carl W.

  • fYear
    1993
  • fDate
    17-21 Oct 1993
  • Firstpage
    590
  • Abstract
    The need for design for testability (DFT) in mixed-signal boards and systems is becoming more significant as the miniaturization and superintegration trends continue. Accessibility to critical nodes of the circuits is required in order to meet the demands for higher quality, lower cost, shorter time to market, continuous improvement and standardization. However, we must be prudent in the way we address these demands, especially during the development of the P1149.4 Mixed-Signal Standard, in order to insure the appropriate balance
  • Keywords
    Circuit testing; Consumer electronics; Costs; Design engineering; Design for testability; Electronic equipment testing; Process design; Standardization; System testing; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470650
  • Filename
    470650