Title :
Packaging development for GaAs X-ray line detectors
Author :
Oppermann, Martin ; Albrecht, Oliver ; Lohse, Thomas ; Metasch, René ; Zerna, Thomas ; Wolter, Klaus-Jürgen
Author_Institution :
Electron. Packaging Lab. (IAVT), Tech. Univ. Dresden, Dresden, Germany
Abstract :
Direct converting X-ray line detectors might be a low-cost solution for inline X-ray inspection systems for electronics production and other industries. Possible detector materials are semiconductors in general, in our case GaAs.
Keywords :
III-V semiconductors; X-ray apparatus; chemical sensors; electronics packaging; gallium arsenide; inspection; GaAs; X-ray line detectors; electronic production; inline X-ray inspection systems; packaging development; Absorption; Detectors; Gallium arsenide; Integrated circuits; Lead; Packaging;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1983-7
Electronic_ISBN :
978-1-4577-1981-3
DOI :
10.1109/EPTC.2011.6184416
