Title :
Structured CBIST in ASICS
Author_Institution :
Sequent Comput. Syst., Beaverton, OR, USA
Abstract :
A novel method for automating the installation of CBIST and moving test development forward in the design cycle is shown, including a practical method for determining CBIST pathology. Three ASICS have been developed with this method. Design and prototype results are given
Keywords :
application specific integrated circuits; automatic test equipment; built-in self test; design for testability; logic testing; ASIC; ATE; CBIST; circular BIST; design; pathology checker; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Hardware design languages; Logic testing; Pathology; Registers; Runtime; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470680
