Title :
Technology-independent boundary scan synthesis (technology and physical issues)
Author :
Robinson, Markus F. ; Mailhot, Frederic ; Konsevich, Jim
Author_Institution :
Synopsys Inc., Mountain View, CA, USA
Abstract :
The paper presents key technology and physical issues associated with a boundary scan synthesis system. The system accommodates multiple vendor technologies and the requirements of (sometimes non-1149.1 compliant) user specified boundary scan architectures that access core test structures
Keywords :
automatic testing; boundary scan testing; logic testing; boundary scan synthesis; logic testing; multiple vendor technologies; user specified boundary scan architectures; ANSI standards; Access protocols; Circuit testing; Clocks; Logic testing; Process design; Registers; Robustness; Signal design; Signal synthesis;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470706
