Title :
Proceedings of IEEE International Test Conference - (ITC)
Abstract :
The following topics are dealt with: system testing; CMOS bridging faults; SPC-based intelligent test; test generation software; IEEE standard 1149.1; software testability; cost-effective ATE application; delay testing; self-test; improving CMOS IC quality; mixed-signal testing; BIST; multichip module testing; design-for-testability; fast test generation; test engineering strategies; tests data management; timing systems; realistic quality practices; constrained test generation; power supply current testing; board test; synthesis and testability; memory test; software testing; physical-defect detection
Keywords :
CMOS integrated circuits; IEEE standards; VLSI; automatic test equipment; automatic test software; automatic testing; delays; design for testability; fault diagnosis; fault location; integrated circuit testing; logic testing; power supplies to apparatus; printed circuit testing; quality control; statistical process control; BIST; CMOS IC quality; CMOS bridging faults; IEEE standard 1149.1; SPC; board test; constrained test generation; cost-effective ATE; delay testing; design-for-testability; intelligent test; memory test; mixed-signal testing; multichip module testing; physical-defect detection; power supply current testing; quality practices; self-test; software testability; synthesis; system testing; test engineering; test generation software; tests data management; timing systems;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470723
