Title :
The Impact of Spot Size and Location on Current Density
Author :
Malucci, Robert D.
Keywords :
Accelerated aging; Acceleration; Aluminum; Contact resistance; Copper; Current density; Degradation; Equations; Heating; Tin;
Conference_Titel :
Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
Conference_Location :
Vancouver, British Columbia, Canada
Print_ISBN :
978-1-4244-3613-2
Electronic_ISBN :
978-1-4244-3613-2
DOI :
10.1109/HOLM.2009.5284401
