DocumentCode
1829720
Title
A 10-bit 8.3MS/s switched-current successive approximation ADC for column-parallel imagers
Author
Yang, Zheng ; Van der Spiegel, Jan
Author_Institution
Dept. of Electr. & Syst. Eng., Univ. of Pennsylvania, Philadelphia, PA
fYear
2008
fDate
18-21 May 2008
Firstpage
224
Lastpage
227
Abstract
This paper describes a switched-current successive approximation ADC for high resolution current mode imagers. The ADC is suitable to be integrated at the column level and operate in parallel. Designed in a 0.25 mum CMOS process, its core occupies only 24 mum x 200 mum and consumes 930 muW. Having a low input impedance of 0.6 Omega, it can connect directly to the imaging array while providing a stable bias voltage on the input line. The ADC is built around a single current comparator and an 11-bit sub-binary current DAC. It has no sampling stages. The output is digitally calibrated in order to compensate for component mismatch. Simulation results on both static and dynamic performance are presented. With calibration, the ADC achieves an effective resolution of 10 bits at 8.3 MS/s.
Keywords
CMOS image sensors; analogue-digital conversion; ADC; CMOS process; column-parallel imagers; high resolution current mode imagers; imaging array; power 930 muW; size 0.25 mum; switched-current successive approximation; CMOS process; Calibration; Circuits; High-resolution imaging; Image converters; Image resolution; Image sampling; Pixel; Sampling methods; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4541395
Filename
4541395
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