Title :
An ADT comprehensive evaluation method based on Bayesian
Author :
Wang, Lizhi ; Jiang, Tongmin ; Li, Xiaoyang ; Zhang, Jingrui
Author_Institution :
Sch. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
Accelerated degradation testing (ADT) is used to obtain performance parameter in a short time and extrapolate the lifetime and reliability of the products under normal operation conditions. However, sometimes the degradation information from ADT is not enough for the limited cost and time, and the evaluation accuracy of the lifetime and reliability would be low for it. To solve this problem, this paper presents an ADT comprehensive evaluation method based on Bayesian theory, and take super luminescent diode (SLD) as an example to explain the application of this method.
Keywords :
Bayes methods; life testing; product life cycle management; superluminescent diodes; Bayesian theory; accelerated degradation testing comprehensive evaluation method; product lifetime; product reliability; super luminescent diode; Bayesian methods; Mechanical products; Monitoring; Reliability; Stress; Superluminescent diodes; Testing; Bayesian; SLD; accelerated degradation testing; comprehensive evaluation; reliability;
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location :
Macao
Print_ISBN :
978-1-4244-8501-7
Electronic_ISBN :
2157-3611
DOI :
10.1109/IEEM.2010.5674568
